Filter Results By:

Products

Applications

Manufacturers

Showing results: 1 - 15 of 93 items found.

  • High Speed Load Cell Test Interface

    LCIC-4CH - Industrial Measurement Systems Ltd.

    The latest stand-alone controller model: LCIC-4CH, was specially designed to fit portable wheel and axle scales for determining the weight of trucks or heavy vehicles either in static mode or in motion, with very high accuracy and very friendly to operate. The In-motion speeds up the weighing process and allows weighing a truck without the need to stop.In the last 16 years, our stand-alone High-Speed weighing-in-motion controller model: LCIC-WIM was sold all around the world and as for today, thousands are being in use when among our customers are some well known weighing manufacturers.Most of our customers around the world are scale manufacturers or integrators that were able to offer the market the most advanced WIM scale with very short time to market and minimum R&D expenses.

  • Load Board

    cPCI 3U - Kontron

    Load boards are essential in keeping any system in top running shape. As a full-system provider, Hartmann strives to not only provide the systems you need, but the supporting hardware as well.

  • Load Board

    cPCI Serial 3U - Kontron

    Load boards are essential in keeping any system in top running shape. As a full-system provider, Hartmann strives to not only provide the systems you need, but the supporting hardware as well.

  • Load Board

    cPCI 6U - Kontron

    Load boards are essential in keeping any system in top running shape. As a full-system provider, Hartmann strives to not only provide the systems you need, but the supporting hardware as well.

  • Load Module for SLSC

    Bloomy Controls, Inc.

    Bloomy's 8-Channel Load Module provides isolated current and voltage measurements for eight on-board 5W loads or for eight off-board 120W loads. With built-in switching for calibration and fault injection, the module provides unsurpassed capability for Mil/Aero applications. The module also provides switching and connections to allow switching between a real load (e.g., actuator, valve, etc.) and the simulated load.

  • PCIe 5.0 Test Platform

    PXP-500A - Teledyne LeCroy

    The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.

  • PCI Express 5.0 Test Platform

    Teledyne LeCroy

    Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.

  • ARINC 818 Tester

    iWave Systems Technologies

    iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces

  • FPD Tester Model

    27014 - Chroma ATE Inc.

    Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.

  • Semiconductor Test System

    TS-960e - Marvin Test Solutions, Inc.

    The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.

  • Regenerative Battery Pack Test System

    17020E - Chroma ATE Inc.

    Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel

  • VLSI Test System

    3380P - Chroma ATE Inc.

    The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.

  • Regenerative Battery Pack Test System

    17040E - Chroma ATE Inc.

    High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions

  • VLSI Test System

    3380D - Chroma ATE Inc.

    The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.

  • OLED Lifetime Test System

    58131 - Chroma ATE Inc.

    The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.

Get Help